HOT DI WATER IS MUCH BETTER THAN COLD DI WATER:
Cleaning processes that use sulfuric acid (i.e. prediffusion clean and resist stripping) leave residual chemical particles that can affect yields and throughput. Particulates can be produced in as little as 48 hours via the migration and nucleation of the H4SO4 molecules. Additional process steps that have been taken to address this problem include:
These additional steps are undesirable because:
REDUCE THE NUMBER OF PROCESS STEPS
NEEDED (OR ELIMINATE THEM ENTIRELY), YET STILL ACHIEVE YOUR GOAL OF CLEANER
WAFERS
When heated, ultrapure DI water is much more aggressive and therefore more
effective than cold DI water in rinsing applications. Prediffusion cleaning
chemicals and photo-resist from wafers are more soluble in Hot DI water and
therefore more easily removed. The Lufran® UP Series features an all fluoropolymer,
PVDF and red silicone fluid path which provides instantaneous heating of water
while avoiding any potential contact of the process water with metal components.
The H2OT SHOT quartz series heater utilizes all type 214 quartz and
PFA wetted parts for ultra clean performance. One Process Technology/Lufran®
customer reported, "The total ionic concentration as measured by ultratrace
ion chromatography consistently demonstrated no increase in any ionic species.
No ions or metal were detected in either the UPW feed or the HUPW system
product". Wafer yields are increased because the process environment is not
contaminated with metal ions or other impurities.
REDUCE DI WATER CONSUMPTION OF UP TO
70% AND REDUCE USAGE OF HAZARDOUS CHEMICALS:
The molecules in heated DI water possess a higher level of energy than cold
water molecules. When transferred to the wafer surface the high translational
energy of the water molecules quickly dissolves and dilutes process chemicals
off the wafers. This results in dramatically reducing the amount of water needed
to effectively rinse the wafers. One customer wrote, "A hot DI rinse at post
H2SO4 locations reduces the average SRD TPT (Spin
Rinse Dryer, Total Process Time) needed after standard rinse cycles from 9
min. to 30 sec." In addition, using heated DI water rinsing avoids the need
to use hazardous chemicals, i.e., HF and RCA cleans.
REDUCE BACTERIAL CONTAMINATION AND
IMPROVE PROCESS YIELDS
Wet process stations provide an excellent environment for the growth of
bacteria. Usual causes are low or intermittent flow of DI water, airborne
bacteria and cross contamination from filters. Lufran® DI Water
Heaters reduce bacterial growth throughout the point-of-use water distribution
system. By heating your DI water to 90°C, it is possible to sanitize internal
plumbing without resorting to the disassembly of the station components or by
using potentially hazardous chemicals. Furthermore, downtime is eliminated, as
are associated labor costs that would be required for sanitizing via the use of
chemicals. By reducing bacteria contamination, production yields can be
improved.
ENSURE CONSTANT DI WATER TEMPERATURE
DI water temperatures can vary by as much as 10°C depending on the location and
season. This undesired variability in water and process temperatures can be
avoided by heating the water to a constant temperature with the UP Series DI
Water Heater. Temperature and humidity in cleanrooms are maintained at great
expense. Eliminating temperature variations in DI water is extremely important,
since DI water will come in direct contact with the wafers throughout numerous
processing steps.
REDUCE THERMAL SHOCK
Many strip, etch and develop processes are operated at elevated temperatures.
RCA cleaning and silicon nitride etch processes are commonly heated to 45, 140
and 185°C respectively. Transferring wafers from a hot acid environment to a
cold 23°C DI water rinse could result in thermal shock and damage the wafers.
Heating your DI water can eliminate potential risks associated with thermal
shock.
INCREASE PRODUCTION THROUGHPUT
Heating DI water will result in increased throughput for virtually any process.
For example, by utilizing hot DI water, cleaning times in wafer boat and box
cleaning equipment can be reduced by as much as 60%. Rinse times for wafers that
have been processed in barrel reactors can be reduced by as much as 80%. By
heating the hot DI water it effectively removes fluoro-polymer contamination
from the wafer surfaces.